(cache)Spline Interpolation-Based Multi-Scale Model for Etching in a Chlorine-Argon Inductively Coupled Plasma | IEEE Conference Publication | IEEE Xplore

Spline Interpolation-Based Multi-Scale Model for Etching in a Chlorine-Argon Inductively Coupled Plasma


Abstract:

A multi-variable spline interpolation is used in order to quickly obtain the wafer incident fluxes from inside an inductively coupled plasma chamber with a chlorine and a...Show More

Abstract:

A multi-variable spline interpolation is used in order to quickly obtain the wafer incident fluxes from inside an inductively coupled plasma chamber with a chlorine and argon chemistry. The data is obtained by performing a total of 18 750 chamber simulations while varying the inputs which include the inductive coil power, the gas flow rate, the chamber pressure, the chlorine gas concentration ratio, the temperature, and the applied bias voltage. The data is used to generate a six-dimensional hypercube for each flux of interest where each dimension corresponds to one of the varied parameters. The fluxes are then incorporated into a semi-empirical feature scale plasma etching model in the process simulation tool ViennaPS. The chemical sticking coefficient is derived from measurements and the model includes the etch rate resulting from the chemical etch component, ion sputtering, and ion-enhanced etching.
Date of Conference: 15-18 December 2024
Date Added to IEEE Xplore: 20 January 2025
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Conference Location: Orlando, FL, USA

1 Introduction

A fundamental processing step for the fabrication of semiconductor devices is plasma etching (Huff 2021; Krüger et al. 2024). In particular, the patterning of metal-nitrides such as TiN and AlN has been frequently performed using an inductively coupled plasma (ICP) with chlorine and argon gases (Kim et al. 2011; Woo et al. 2011; Lee Sang et al. 2015; Woo et al. 2022). ICP is a means to deliver power to the electrons without the need for elevated temperatures. The electrons then initiate collisions with gas molecules, resulting in the formation of neutral radical species and charged ions (Hori 2022). These two types of species are mainly responsible for surface interactions and ultimate material removal.

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